Analytic Scanning Electron Microscope (SEM) MYRA3 GMU, with autoemission electron source (Field Emission Gun, FEG) for chemical (EDS, WDS), crystallography (EBSD) and tensile stage for in-situ mechanical testing at room or hight temperature. Microscope for analyses of metallic as well as non-metallic materials in the mode of low vacuum.

• Electron source: Field Emission Gun (FEG) optimized for high resolution, brightness and electron current
• Accelerating voltage: 0,05 up to 30 kV
• Detectors: SE, BSE, in-lens SE
• In-lens SE detector: resolution 1 nm at 30 kV
• e-Beam deceleration: non-conductive samples
• Chemical analysis: Energy Dispersive (EDX)
• Crystallographic analysis (EBSD) with in situ mechanical and thermal loading tests of the samples → max. loading force up to 2 000 N, max. temperature up to 600 °C